Coupling length of silicon-on-insulator directional couplers probed by Fourier-space imaging
J. Jagerska, N. Le Thomas, R. Houdre, D. M. Beggs, D. O'Brien et al.
We use a Fourier-space imaging technique relying on outcoupling grating probes to study the coupled mode interaction and dispersion properties of guided modes in silicon-on-insulator codirectional couplers. Our approach allows us to measure the mode splitting inherent to coupled systems, determine t ... [Appl. Phys. Lett. 92, 151106 (2008)] published Tue Apr 15, 2008.
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We use a Fourier-space imaging technique relying on outcoupling grating probes to study the coupled mode interaction and dispersion properties of guided modes in silicon-on-insulator codirectional couplers. Our approach allows us to measure the mode splitting inherent to coupled systems, determine t ... [Appl. Phys. Lett. 92, 151106 (2008)] published Tue Apr 15, 2008.
Read full Article »
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