Direct measurement of the complex refractive index in the extreme ultraviolet spectral region using diffraction from a nanosphere array

B. Mills, C. F. Chau, E. T. F. Rogers, J. Grant-Jacob, S. L. Stebbings et al.
Using extreme ultraviolet (XUV) radiation from a high harmonic source, we observe diffraction from a single-layer self-assembled hexagonal array of 1961.2 nm diameter polystyrene spheres. The Mie solution is used to predict the correct form factor for a single sphere and hence model the intensities ... [Appl. Phys. Lett. 93, 231103 (2008)] published Tue Dec 9, 2008.
Read full Article »

Leave a Reply

*
To prove that you're not a bot, enter this code
Anti-Spam Image