Nanoscale optical tomography using volume-scanning near-field microscopy
Jin Sun, John C. Schotland, Rainer Hillenbrand, and P. Scott Carney
The relationship between sample structure and data in volume-scanning backscattering mode near-field optical microscopy is investigated. It is shown that the three-dimensional structure of a dielectric sample is encoded in the phase and amplitude of the scattered field and that an approximate recons ... [Appl. Phys. Lett. 95, 121108 (2009)] published Wed Sep 23, 2009.
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The relationship between sample structure and data in volume-scanning backscattering mode near-field optical microscopy is investigated. It is shown that the three-dimensional structure of a dielectric sample is encoded in the phase and amplitude of the scattered field and that an approximate recons ... [Appl. Phys. Lett. 95, 121108 (2009)] published Wed Sep 23, 2009.
Read full Article »
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