Spectrally resolved confocal microscopy for laser mode imaging and beam characteristic investigations
W. Brezna and J. Smoliner
In this letter, confocal optical microscopy is used to investigate the intensity patterns of an infrared vertical cavity surface emitting laser in three dimensions with high spectral resolution. The measurements were performed between the near field (Fresnel) regime and the far field (Fraunhofer) re ... [Appl. Phys. Lett. 95, 201118 (2009)] published Fri Nov 20, 2009.
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In this letter, confocal optical microscopy is used to investigate the intensity patterns of an infrared vertical cavity surface emitting laser in three dimensions with high spectral resolution. The measurements were performed between the near field (Fresnel) regime and the far field (Fraunhofer) re ... [Appl. Phys. Lett. 95, 201118 (2009)] published Fri Nov 20, 2009.
Read full Article »
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