The perfect absorber
E. F. C. Driessen and M. J. A. de Dood
We demonstrate that films of very lossy metal or dielectric, with a thickness of only a few nanometers, can absorb almost all incident radiation when illuminated from the substrate side at the critical angle for total internal reflection. The absorption for s-polarized light approaches 100%, while t ... [Appl. Phys. Lett. 94, 171109 (2009)] published Wed Apr 29, 2009.
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We demonstrate that films of very lossy metal or dielectric, with a thickness of only a few nanometers, can absorb almost all incident radiation when illuminated from the substrate side at the critical angle for total internal reflection. The absorption for s-polarized light approaches 100%, while t ... [Appl. Phys. Lett. 94, 171109 (2009)] published Wed Apr 29, 2009.
Read full Article »
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